Manipulación de la trayectoria de electrones por medio de materiales dieléctricos : influencia de la corriente del haz incidente en el ángulo de deflexión durante el efecto guiding con electrones de 5 keV.

Abstract

The manipulation of the trajectory of charged particles through the use of insulating samples is known as the guiding effect. In this present study, this effect was investigated for a 5 keV electron beam incident upon a square borosilicate plate measuring 10 centimeters on each side. The work was conducted under high vacuum conditions (approximately ten power minus six Torr). A Faraday cup was employed for the measurement of the beam current scattered by the sample. Within this context, two Faraday cup movement schemes were compared: a linear one, perpendicular to the sample, and an angular one, with its axis of rotation at the sample holder. Furthermore, the dependence of the incident current intensity on the sample, in a range of 10 to 1000 μA, was studied with respect to the deflected beam parameters. Among the most significant outcomes of the project, it is worth noting that the incident beam could be deflected up to an angle of 26.56 degrees. On the other hand, it was observed that the linear scheme has a limitation in capturing electrons at nearly twice the intensity at its measurement endpoints. An exponential dependence of the transmitted current was evident concerning the angle of inclination of the sample. The transmitted current is in all cases at least 10 times lower than the incident current. It was verified that there is no dependence of the guiding effect on the current intensity irradiated onto an insulating sample. Finally, a scaling equation for current profiles collected at different incidence currents was established. This equation does not establish a direct relationship between the ratio of incidence currents and the measured currents.