Diseño y construcción de una máquina para tomar mediciones de las propiedades de un material termoeléctrico de película delgada introduciendo parámetros de temperatura y flexión

Abstract

In the present work, a machine is designed and constructed that applies temperature, bending and positioning parameters to N and P type thin-film semiconductor specimens, which have thermoelectric properties, in order to electrically characterize the semiconductor using the Van Der Pauw technique. The semiconductor material is provided by Harriot-Watt University as a cooperative agreement for the publication of a scientific article. The project is based on the concurrent design criteria of Carles Riba's book, by means of which a solution according to the required needs is obtained; the machine was submitted to tests of operation of variation of temperature to different radii of curvature. The performance tests reveal a higher average temperature gradient on the measuring surface in negative bending blocks with a bending radius of 17.60 mm at a test temperature of 150°C with the help of two heaters; on the other hand the maximum conductivity corresponds to the transverse axis of the 18B-05-03 N-type specimen under stress whose peak corresponds to the positive bending block with a radius of 68.80 mm and a non-linear decreasing tendency at a temperature of 60°C.